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3. SP25M

SP25M (CCA_039)

SP25M
  
Product Detail  

SP25M compact scanning probe system

The world’s most compact andversatile scanning system

The SP25M is two sensors in one, and has unrivalled flexibility due to the system’s modularity. Users can scan for form and take high accuracy discrete points by using a dedicated scanning module or, alternatively, use an adaptor to carry Renishaw’s TP20 range of touch-trigger probe modules.
The SP25M’s compact size and autojoint mounting makes it compatible with PH10M, PH10MQ and PH6M probe heads. It can also be mounted on an extension bar, providing excellent reach and access to part features.
Three scanning modules feature a pivoting design which delivers exceptional dynamic performance and optimised high accuracy performance over the entire stylus range from 20 to 200 mm long. This avoids most of the performance loss seen in other scanning probes as stylus length increases.
Module and stylus changing is enabled using the FCR25 flexible change rack, which can be located either on the CMM bed, or in Renishaw’s MRS modular
rack system.

Key benefits

Excellent part accessibility
At just 25 mm (0.97 in) diameter, the SP25M is small and
light, making it ideally suited to mounting on articulating
heads and on extensions of up to 100 mm (3.94 in). Thus a
total reach of some 400 mm (15.75 in) is possible. However,
it is also sufficiently compact to suit very small CMM’s and
multi-sensor machines.
Modularity to allow unrivalled flexibility
The SP25M system allows the user to configure a basic
installation which can be readily expanded at any time. This
can include any, or all, system elements, plus automated rack
changing for optimum productivity.
Two sensors in one - scanning and touch-trigger
SP25M allows the user to always select the most suitable
measurement solution to match the application. Scanning or
touch trigger? Now you can efficiently do both with a single
probe system!

Innovations

Isolated optical metrology
A pivoting mechanism and isolated optical metrology system
measure probe deflection ‘back to earth’. This avoids errors
generated in stacked measurement axes, as used in ‘tower’
scanning probes.
Three scanning modules provide optimal performance
across a range of stylus lengths

Each scanning module has a spring rate and gain optimised
for a range of stylus lengths. SP25M measures accurately
with styli up to 200 mm long. This breakthrough technology
puts SP25M into a class of its own.
3rd order polynomial calibration
Renishaw has developed sophisticated calibration methods
for its range of scanning probes to ensure maximised
performance. SP25M uses the most advanced of these
methods.

 

 

 Download Specification Here



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Category : Probe

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